Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology / Petr Klapetek.

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TextSeries: Micro & nano technologiesPublisher: Amsterdam ; New York : William Andrew/Elsevier, 2013Edition: First editionDescription: xi, 321 pages : illustrations ; 25 cmContent type:

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Item type	Current library	Call number	Status	Barcode
General Collection	Main Campus Library General Stacks	QH212 .S33 2013 (Browse shelf(Opens below))	Available	00026422

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Includes bibliographical references and index.

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