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Atomic Force Microscopy in Process Engineering An Introduction to AFM for Improved Processes and Products edited by W. Richard Bowen, Nidal Hilal
Material type:
TextPublication details: Burlington Elsevier/Butterworth-Heinemann 2009Description: xvi, 283p:24 cm Includes bibliographical references and indexISBN: - 9781856175173
- QH 212 .A78 B69 2009
| Item type | Current library | Call number | Status | Barcode | |
|---|---|---|---|---|---|
| General Collection | Main Campus Library General Stacks | QH 212 .A78 B69 2009 (Browse shelf(Opens below)) | Available | 00019715 |
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