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Fundamental principles of engineering nanometrology / Richard Leach.
Material type:
TextSeries: Micro & nano technologiesPublisher: Amsterdam : Elsevier, William Andrew, 2014Edition: Second editionDescription: xxvi, 321 pages : illustrationsContent type: - text
- unmediated
- volume
- 9781455777532
- 1455777536
- T174.7 .L42 2010
| Item type | Current library | Call number | Status | Barcode | |
|---|---|---|---|---|---|
| General Collection | Main Campus Library General Stacks | T174.7 .L42 2010 (Browse shelf(Opens below)) | Available | 00021160 |
Includes bibliographical references and index.
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