Atomic Force Microscopy in Process Engineering  An Introduction to AFM for Improved Processes and Products 
edited by W. Richard Bowen, Nidal Hilal  
 - Burlington   Elsevier/Butterworth-Heinemann  2009 
 - xvi, 283p:24 cm  Includes bibliographical references and index  
<br/><br/><label>ISBN: </label>9781856175173 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Production Engineering ; <br/>Atomic Force Microscopy
<br/><br/><label>LC Class. No.: </label>QH 212  / .A78 B69 2009