TY  - BOOK
AU  - Bowen W. Richard
AU  - Hilal, Nidal
TI  - Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products
SN  - 9781856175173
AV  - QH 212 .A78 B69 2009
PY  - 2009///
CY  - Burlington 
PB  - Elsevier/Butterworth-Heinemann
KW  - Production Engineering ;
KW  - Atomic Force Microscopy
ER  -