TY  - BOOK
AU  - Heyman,Joseph S.
ED  - Electronics Reliability and Measurement Technology Workshop
TI  - Electronics reliability and measurement technology: nondestructive evaluation 
SN  - 081551171X :
AV  - TK7874 .E486 1988
U1  - 621.381/028/7 19
PY  - 1988///
CY  - Park Ridge, N.J., U.S.A.
PB  - Noyes Data Corp.
KW  - Integrated circuits
KW  - Testing
KW  - Congresses
KW  - Reliability
KW  - Nondestructive testing
N1  - "The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--P. vii; Includes bibliographies and index
UR  - http://www.loc.gov/catdir/description/wap041/88025395.html
ER  -