Atomic Force Microscopy in Process Engineering An Introduction to AFM for Improved Processes and Products edited by W. Richard Bowen, Nidal Hilal

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Material type: Text

TextPublication details: Burlington Elsevier/Butterworth-Heinemann 2009Description: xvi, 283p:24 cm Includes bibliographical references and indexISBN:

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Item type	Current library	Call number	Status	Barcode
General Collection	Main Campus Library General Stacks	QH 212 .A78 B69 2009 (Browse shelf(Opens below))	Available	00019715

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