| 000 | 01224nam a22002777a 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20210115085756.0 | ||
| 008 | 210115b ||||| |||| 00| 0 eng d | ||
| 020 |
_a081551171X : _c$36.00 |
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| 040 |
_aLC _cLC _dLC |
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| 050 | 0 | 0 |
_aTK7874 _b.E486 1988 |
| 082 | 0 | 0 |
_a621.381/028/7 _219 |
| 245 | 0 | 0 |
_aElectronics reliability and measurement technology : _bnondestructive evaluation / _cedited by Joseph S. Heyman. |
| 260 |
_aPark Ridge, N.J., U.S.A. : _bNoyes Data Corp., _cc1988. |
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| 300 |
_axii, 128 p. : _bill. ; _c27 cm. |
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| 500 | _a"The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--P. vii. | ||
| 504 | _aIncludes bibliographies and index. | ||
| 650 | 0 |
_aIntegrated circuits _xTesting _vCongresses. |
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| 650 | 0 |
_aIntegrated circuits _xReliability _vCongresses. |
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| 650 | 0 |
_aNondestructive testing _vCongresses. |
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| 700 | 1 | _aHeyman, Joseph S. | |
| 711 | 2 |
_aElectronics Reliability and Measurement Technology Workshop _d(1986 : _cNASA Langley Research Center) |
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| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/description/wap041/88025395.html |
| 906 |
_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg |
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| 942 |
_2lcc _cBK |
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| 999 |
_c8908 _d8908 |
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