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Fundamental principles of engineering nanometrology / Richard Leach.
Material type:
TextSeries: Micro & nano technologiesPublisher: Amsterdam : Elsevier, William Andrew, 2014Edition: Second editionDescription: xxvi, 321 pages : illustrationsContent type: - text
- unmediated
- volume
- 9781455777532
- 1455777536
- T174.7 .L42 2010
| Item type | Current library | Call number | Status | Barcode | |
|---|---|---|---|---|---|
| General Collection | Main Campus Library General Stacks | T174.7 .L42 2010 (Browse shelf(Opens below)) | Available | 00021160 |
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| T173.8 .P36 2001 1970-90 : | T174 .B66 2005 Nanotechnology | T174.7 .E458 2009 Emerging nanotechnologies for manufacturing / | T174.7 .L42 2010 Fundamental principles of engineering nanometrology / | T174.7 .N37369 2010 Nanotechnology environmental health and safety : | T175 C45 2008 Economics of innovation : incentives, cooperation, and R & D policy | T353 .A56 2016 Engineering drawing;/ DR M.H.Annaiah,DR.B.Sudheer prem kumar,DR.C.N.Chandrappa |
Includes bibliographical references and index.
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