Electronics reliability and measurement technology : nondestructive evaluation /
Electronics reliability and measurement technology : nondestructive evaluation /
edited by Joseph S. Heyman.
- Park Ridge, N.J., U.S.A. : Noyes Data Corp., c1988.
- xii, 128 p. : ill. ; 27 cm.
"The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--P. vii.
Includes bibliographies and index.
081551171X : $36.00
Integrated circuits--Testing--Congresses.
Integrated circuits--Reliability--Congresses.
Nondestructive testing--Congresses.
TK7874 / .E486 1988
621.381/028/7
"The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--P. vii.
Includes bibliographies and index.
081551171X : $36.00
Integrated circuits--Testing--Congresses.
Integrated circuits--Reliability--Congresses.
Nondestructive testing--Congresses.
TK7874 / .E486 1988
621.381/028/7