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Electronics reliability and measurement technology : nondestructive evaluation / edited by Joseph S. Heyman.

Contributor(s): Material type: TextTextPublication details: Park Ridge, N.J., U.S.A. : Noyes Data Corp., c1988.Description: xii, 128 p. : ill. ; 27 cmISBN:
  • 081551171X :
Subject(s): DDC classification:
  • 621.381/028/7 19
LOC classification:
  • TK7874 .E486 1988
Online resources:
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Item type Current library Call number Status Barcode
General Collection Main Campus Library General Stacks TK7874 .E486 1988 (Browse shelf(Opens below)) Available 00024107

"The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--P. vii.

Includes bibliographies and index.

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