Electronics reliability and measurement technology : (Record no. 8908)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 01224nam a22002777a 4500 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | OSt |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20210115085756.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 210115b ||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 081551171X : |
| Terms of availability | $36.00 |
| 040 ## - CATALOGING SOURCE | |
| Original cataloging agency | LC |
| Transcribing agency | LC |
| Modifying agency | LC |
| 050 00 - LIBRARY OF CONGRESS CALL NUMBER | |
| Classification number | TK7874 |
| Item number | .E486 1988 |
| 082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.381/028/7 |
| Edition number | 19 |
| 245 00 - TITLE STATEMENT | |
| Title | Electronics reliability and measurement technology : |
| Remainder of title | nondestructive evaluation / |
| Statement of responsibility, etc. | edited by Joseph S. Heyman. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | Park Ridge, N.J., U.S.A. : |
| Name of publisher, distributor, etc. | Noyes Data Corp., |
| Date of publication, distribution, etc. | c1988. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xii, 128 p. : |
| Other physical details | ill. ; |
| Dimensions | 27 cm. |
| 500 ## - GENERAL NOTE | |
| General note | "The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--P. vii. |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE | |
| Bibliography, etc. note | Includes bibliographies and index. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Integrated circuits |
| General subdivision | Testing |
| Form subdivision | Congresses. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Integrated circuits |
| General subdivision | Reliability |
| Form subdivision | Congresses. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Nondestructive testing |
| Form subdivision | Congresses. |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Heyman, Joseph S. |
| 711 2# - ADDED ENTRY--MEETING NAME | |
| Meeting name or jurisdiction name as entry element | Electronics Reliability and Measurement Technology Workshop |
| Date of meeting or treaty signing | (1986 : |
| Location of meeting | NASA Langley Research Center) |
| 856 42 - ELECTRONIC LOCATION AND ACCESS | |
| Materials specified | Publisher description |
| Uniform Resource Identifier | <a href="http://www.loc.gov/catdir/description/wap041/88025395.html">http://www.loc.gov/catdir/description/wap041/88025395.html</a> |
| 906 ## - LOCAL DATA ELEMENT F, LDF (RLIN) | |
| a | 7 |
| b | cbc |
| c | orignew |
| d | 1 |
| e | ocip |
| f | 19 |
| g | y-gencatlg |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Source of classification or shelving scheme | Library of Congress Classification |
| Koha item type | General Collection |
| Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Home library | Current library | Shelving location | Date acquired | Source of acquisition | Cost, normal purchase price | Total Checkouts | Full call number | Barcode | Date last seen | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Library of Congress Classification | Main Campus Library | Main Campus Library | General Stacks | 15/01/2021 | Gabby | 10800.00 | TK7874 .E486 1988 | 00024107 | 15/01/2021 | 15/01/2021 | General Collection |