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Electronics reliability and measurement technology : nondestructive evaluation / edited by Joseph S. Heyman.
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TextPublication details: Park Ridge, N.J., U.S.A. : Noyes Data Corp., c1988.Description: xii, 128 p. : ill. ; 27 cmISBN: - 081551171X :
- 621.381/028/7 19
- TK7874 .E486 1988
| Item type | Current library | Call number | Status | Barcode | |
|---|---|---|---|---|---|
| General Collection | Main Campus Library General Stacks | TK7874 .E486 1988 (Browse shelf(Opens below)) | Available | 00024107 |
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| TK7872.F5 M668 2007 Surface acoustic wave filters : | TK7872.P38 B475 2007 Phase-locked loops: | TK7872.T55 S92 1998 Thin film materials for large area electronics : proceedings of Symposium E on Thin Film Materials for Large Area Electronics of the E-MRS 1998 Spring Conference, Strasbourg, France, June 16-19, 1998 / | TK7874 .E486 1988 Electronics reliability and measurement technology : nondestructive evaluation / | TK7874 .H3494 1991 Handbook of VLSI microlithography : | TK7874 .H3494 2001 Handbook of VLSI microlithography : | TK7874.65 .H64 2003 Analysis and design of digital integrated circuits : |
"The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--P. vii.
Includes bibliographies and index.
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